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DLG Contact Measurement Probe DLG Contact Measurement Probe
DLG Contact Measurement Probe

EMOS GROUP
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DLG Contact Measurement Probe

MICROSENSOR contact measurement probes enable fast and easy acquisition of not only basic measurements such as distance, thickness, position, and height, but also more complex measurements like flatness, form, and difference.

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DLG CONTACT MEASUREMENT PROBE

MICROSENSOR contact measurement probes provide high-accuracy detection of absolute differences between the outer surfaces of materials and a reference surface through direct contact.

In addition to basic measurements such as distance, thickness, position, and height, they enable fast and easy acquisition of more complex measurements like flatness, form, and difference.

By utilizing different stroke lengths, they allow precise measurements without the need for expensive measurement devices or systems.

DLG CONTACT MEASUREMENT PROBE APPLICATION AREAS

Height measurement

Position and location measurement

Thickness, width, vibration, and dimensional measurements

Probes with selectable contact tips and adjustable measuring force according to the material surface

Flatness, surface form, curvature, and difference measurements between two surfaces

Resolution ± 0.2 µm, ± 0.1 µm, ± 0.5 µm, ± 1.0 µm
Measuring Force < 5N
Voltage Output 5 VDC ±5 %
Measuring Range 25 mm, 30 mm
Signal Output Digital: A / B - RS422, Analog: A / B - 1Vpp
Accuracy ± 3 µm, ± 5 µm
Serial Communication RS422