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MR-D Contact Measurement Probe MR-D Contact Measurement Probe
MR-D Contact Measurement Probe

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MR-D Contact Measurement Probe

MICROSENSOR contact measurement probes enable fast and easy acquisition of not only basic measurements such as distance, thickness, position, and height, but also more complex measurements like flatness, form, difference, runout, and diameter.

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MR-D CONTACT MEASUREMENT PROBE

MICROSENSOR contact measurement probes provide high-accuracy detection of absolute differences between the outer surfaces of materials and a reference surface through direct contact.

In addition to basic measurements such as distance, thickness, position, and height, they enable fast and easy acquisition of more complex measurements like flatness, form, difference, runout, and diameter.

By utilizing different stroke lengths, they allow precise measurements without the need for expensive measuring devices or systems.

MR-D CONTACT MEASUREMENT PROBE APPLICATION AREAS

Height measurement

Position and location measurement

Thickness, width, inner diameter, outer diameter, and dimensional measurements

Runout, oscillation, and vibration measurements
Probes with selectable contact tips and adjustable measuring force according to the material surface

Flatness, surface form, curvature, and difference measurements between two surfaces

Resolution ± 0.2 µm
Measuring Force < 1.0N
Voltage Output 12-24 VDC ±10%
Measuring Range 1 mm
Accuracy ± 5 µm
Serial Communication RS485 (Modbus supported), Modbus ASCII